The Integrated Offline Defect Inspection System for Perovskite Photovoltaics is designed for materials research, device performance evaluation, and failure analysis. Integrating photoluminescence (PL), electroluminescence (EL), and bright- and dark-field automated optical inspection (AOI), the offline system accommodates perovskite and perovskite/silicon tandem cells of various sizes and enables multiscale inspection, from large-area imaging to localized microscopic defect observation. Optional capabilities include high-resolution imaging, PL spectroscopy, time-resolved photoluminescence (TRPL), and photocurrent/photovoltage mapping. Combined with PL quantum yield (PLQY), quasi-Fermi level splitting (QFLS), and pseudo-J–V imaging, these capabilities characterize the spatial distribution of optoelectronic properties in materials and devices. AI-assisted defect identification, classification, statistical analysis, and uniformity assessment help correlate defect characteristics with performance variations, providing experimental insights for materials screening, process optimization, and improvements in efficiency and stability.
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