The TAU‑9000 system employs pump‑probe‑based ultrafast transient spectroscopy imaging to achieve high temporal and spatial resolution characterization of wafer minority carrier lifetimes. Photogenerated carriers are excited by pump light, and their decay dynamics are measured through time-resolved imaging, enabling precise assessment of the effects of dislocations, point defects, and surface contamination on carrier lifetimes, thereby reflecting overall wafer quality.
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- Transient Absorption Series
- TA AUTO/MINI - Ultrafast TAS
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- LFP100 - Flash Photolysis
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- UPSI100 - Pump-Probe Shadowgraph Imaging
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- THZ100 - Terahertz
No classification
- TA AUTO/MINI - Ultrafast TAS
- Fluorenscence Spectroscopy Series
- TPL300 - Steady-State/Transient Fluorescence
No classification
- Wide Bandgap Semiconductor Comprehensive Characterization System
No classification
- UF100 - Ultrafast Fluorescence
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- FLIM300 - Confocal Fluorescence Lifetime Imaging Microscopy
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- TPL300 - Steady-State/Transient Fluorescence
- Non-Linear Optical Series
- ZTS100 - Z-Scan
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- SHG100 - Second Harmonic Generation
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- ZTS100 - Z-Scan
- High-Speed CMOS Camera Series
- High-Speed CMOS Camera
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- High-Speed CMOS Camera
- Laser Series
- FlatTop DPSS ND:YAG Nanosecond Laser
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- FlatTop-OPO DPSS YAG-OPO Laser
No classification
- Semiconductor Optical Inspection Series
- DISPEC-9000 SiC Substrate Wafers
No classification
- DISPEC-8000 SiC Substrate/Seed/Boule
No classification
- SiCM-9000 SiC Epi Carrier Lifetime Imaging
No classification
- SP-1030 Perovskite Solar Cells Performance Analysis
No classification
- DISPEC-9000 SiC Substrate Wafers
- Optical Parametric Oscillator/Amplifier
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- Tunable Nanosecond Pulsed Dye Laser
No classification
- FlatTop DPSS ND:YAG Nanosecond Laser
- Store
- Parts & Components
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- Parts & Components
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