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From Transient Absorption to Fluorescence and Non-linear Spectroscopy and beyond, TTS offers highly customizable, state-of-the-art modular products that empower your research.
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Dislocation inspection system for wide bandgap semiconductors

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Semiconductor Material Inspection
World's first optical non-destructive dislocation inspection tool for SiC wafers, boules, and seed crystals, as well as a large-area perovskite inspection system and more. Redefining the inspection workflow for semiconductor manufacturers, TTS sets a new standard in precision and efficiency.

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Non-destructive Dislocation Defect Inspection Technology Assists The Study of The Growth Mechanism of Dislocation Defects in SiC Crystal

Dislocation defects in SiC wafers, such as TSD, TED, and BPD, critically limit device yield and reliability, while their growth mechanisms remain insufficiently understood. This work presents a fast, non-destructive inspection method based on transient absorption spectroscopy and AI algorithms for accurate defect detection and classification. The study reveals distinct growth modes of threading dislocations and identifies transformation relationships between dislocations and basal plane defects. These findings provide new insights into SiC crystal growth and support improved defect control and wafer quality in semiconductor manufacturing.

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How To Measure Each Subcell’s PL in Perovskite–Silicon Tandems

To measure each subcell’s PL in a perovskite–silicon tandem, combine wavelength-selective excitation with spectrally resolved detection and explicit cross-talk checks.

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PL, EL And AOI: Complementary Perovskite Module Defect Checks

A perovskite defect inspection system needs several forms of contrast because a module defect can affect appearance, recombination, electrical injection, or more than one of these at once. PL maps the response to optical excitation. EL maps emission under electrical injection.

By delivering innovative, reliable, and scalable solutions, we empower industries to achieve unparalleled precision and efficiency, driving progress in research and manufacturing worldwide.

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