Z-Scan System

ZTS100 measures nonlinear absorption/refraction through z-axis scanning. Features closed/open aperture detection with anti-jitter dual-channel design for precise nonlinear coefficient determination.

Dual-channel Anti-jitter Compensation

0.1μm Resolution

Broad Detection Window (350-1700nm)

Inquire

Download datasheet

Product Features

Precision Stage: 0.1μm resolution, <2 μm repeatability.

Broad Detection: 350-1700nm (50nW-20mW).

Anti-jitter: Dual-channel reference compensation.

Auto-alignment: Eliminates manual Z-stage optical adjustment

Auto-switch: Software controlled auto-switch between open and close aperture

SPECIFICATIONS

Precision optical delay stage

Speed	30 mm/s
Minimum resolution	0.1 μm
Repositioning accuracy	< 2 μm

Detector

Probe wavelength	350-1700nm
Power range	50nW - 20mW
Anti-jitter	Simultaneous acquisition of dual-channel reference signals
Auto-alignment Module Section	Range:≥+5°
		Sensitivity: 0.7urad
		Wavelength: 400 - 1100nm
Software (LabView Based)	Automated curve fitting (Transmittance vs. Z-position)
		Two-photon absorption (TPA) calculations
		Data processing and storage

APPLICATION

PUBLICATION

DOWNLOAD

Z-Scan System

Dual-channel Anti-jitter Compensation

0.1μm Resolution

Broad Detection Window (350-1700nm)

Product Features

Product Category

Quick Links