The DISPEC-8000 utilizes the pump-probe reflection principle to perform non-destructive optical inspection of compound semiconductor materials. This system is suitable for inspecting N-type SiC ingots, seed crystals, and wafers, and supports analysis of wafers of various sizes. It can accurately identify key dislocation defects such as TSD, TED, and BPD, while also supporting the detection of various defect types, including SF, MP, carbon inclusions, and epitaxial defects. Additionally, it supports dual-surface analysis of both the Si and C faces. Compared to automated systems, the DISPEC-8000 operates in a manual mode, offering greater flexibility and making it suitable for R&D validation, small-batch testing, and diverse application scenarios.
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- Transient Absorption Series
- TA AUTO/MINI - Ultrafast TAS
No classification
- LFP100 - Flash Photolysis
No classification
- UPSI100 - Pump-Probe Shadowgraph Imaging
No classification
- THZ100 - Terahertz
No classification
- TA AUTO/MINI - Ultrafast TAS
- Fluorenscence Spectroscopy Series
- TPL300 - Steady-State/Transient Fluorescence
No classification
- Wide Bandgap Semiconductor Comprehensive Characterization System
No classification
- UF100 - Ultrafast Fluorescence
No classification
- FLIM300 - Confocal Fluorescence Lifetime Imaging Microscopy
No classification
- TPL300 - Steady-State/Transient Fluorescence
- Non-Linear Optical Series
- ZTS100 - Z-Scan
No classification
- SHG100 - Second Harmonic Generation
No classification
- ZTS100 - Z-Scan
- High-Speed CMOS Camera Series
- High-Speed CMOS Camera
No classification
- High-Speed CMOS Camera
- Laser Series
- FlatTop DPSS ND:YAG Nanosecond Laser
No classification
- FlatTop-OPO DPSS YAG-OPO Laser
No classification
- Semiconductor Optical Inspection Series
- DISPEC-9000 Automatic Non-destructive SiC Substrate Dislocation Defect Inspection System
No classification
- DISPEC-8000 Non-destructive SiC Ingot/Seed/Substrate 3-in-1 Dislocation Defect Inspection System
No classification
- TAU-9000 Minority Carrier Lifetime Imaging System
No classification
- SP-1030 Perovskite Solar Cells Performance Analysis
No classification
- SR-9000 Super-Resolution Detection System for SiC EPI-Wafers and Devices
No classification
- DISPEC-9000 Automatic Non-destructive SiC Substrate Dislocation Defect Inspection System
- Optical Parametric Oscillator/Amplifier
No classification
- Tunable Nanosecond Pulsed Dye Laser
No classification
- FlatTop DPSS ND:YAG Nanosecond Laser
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- Parts & Components
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- Parts & Components
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