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Transient Absorption Series
TA-PRO Ultrafast Transient Absorption Spectroscopy System
TA-LITE Ultrafast Transient Absorption Spectroscopy System
FP100-Laser Flash Photolysis
Fluorenscence Spectroscopy Series
FLIM500 Laser Scanning Confocal Fluorescence Imaging System
SOLARIUM-L Comprehensive Spectroscopy System for Perovskite Materials/Devices
Non-Linear Optical Series
SHG System - Second Harmonic Generation
Z-scan System
High-Speed Camera Series
High-Speed CMOS Camera
Laser Series
High Energy DPSS ND-YAG Nanosecond Laser
High Energy and High Frequency DPSS YAG-OPO Laser
Semicondustor Optical Inspection Series
DISPEC-9000 SiC Substrate Wafers
DISPEC-8000 SiC Substrate/Seed/Boule
TAU-9000 SiC Epi Carrier Lifetime Imaging
SR-9000 SiC EPI-Wafers Super-Resolution Detection System
SP-1030 Perovskite Solar Cells Performance Analysis
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Transient Absorption Series
TA AUTO/MINI - Ultrafast TAS
TA-LITE-Ultrafast Transient Absorption Spectroscopy System
FP100 - Flash Photolysis
UPSI100 - Pump-Probe Shadowgraph Imaging
THZ100 - Terahertz
Fluorenscence Spectroscopy Series
TPL300 - Steady-State/Transient Fluorescence
Wide Bandgap Semiconductor Comprehensive Characterization System
UF100 - Ultrafast Fluorescence
FLIM300 - Confocal Fluorescence Lifetime Imaging Microscopy
Non-Linear Optical Series
ZTS100 - Z-Scan
SHG100 - Second Harmonic Generation
High-Speed CMOS Camera Series
High-Speed CMOS Camera
Laser Series
FlatTop DPSS ND:YAG Nanosecond Laser
FlatTop-OPO DPSS YAG-OPO Laser
Semiconductor Optical Inspection Series
DISPEC-9000 Automatic Non-destructive SiC Substrate Dislocation Defect Inspection System
DISPEC-8000 Non-destructive SiC Ingot/Seed/Substrate 3-in-1 Dislocation Defect Inspection System
TAU-9000 Minority Carrier Lifetime Imaging System
SP-1030 Perovskite Solar Cells Performance Analysis
SR-9000 Super-Resolution Detection System for SiC EPI-Wafers and Devices
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Optical Parametric Oscillator/Amplifier
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By delivering innovative, reliable, and scalable solutions, we empower industries to achieve unparalleled precision and efficiency, driving progress in research and manufacturing worldwide.
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Transient Absorption Series
Fluorenscence Spectroscopy Series
Non-Linear Optical Series
High-Speed Camera Series
Laser Series
Semicondustor Optical Inspection Series
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