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Research-Grade Wide Bandgap Semiconductor Comprehensive Characterization System
Research-Grade Wide Bandgap Semiconductor Comprehensive Characterization System
Materials Tested: SiC, GaN, Ga203, AlGaN, diamond, and other wide/ultra-wide bandgap semiconductors
Broad Wavelength Range: 206/257/343/515/1030 nm (motorized switching) (Deep UV excitation down to 192 nm achievable based on 800 nm laser)
Comprehensive Functionality: Integrated PL, Raman, SHG,and multiple spectroscopic techniques
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Products Feature

  • Materials Tested: SiC, GaN, Ga203, AlGaN, diamond, and other wide/ultra-wide bandgap semiconductors

  • Broad Wavelength Range: 206/257/343/515/1030 nm (motorized switching) (Deep UV excitation down to 192 nm achievable based on 800 nm laser)

  • Comprehensive Functionality: Integrated PL, Raman, SHG,and multiple spectroscopic techniques


Specifications

Fluorescence Module

FeaturesSteady-state FluorescenceWide-field imaging, PL Emission Spectrum, PLI, PL Spectral Imaging
Transient FluorescenceFLIM (via TCSPC)
High-SpeedLED Sources265, 310, 365 nm (selectable)
Uniform Illumination Area>1cm²
Resolution>1.5 μm/pixel
Camera2048×2048 pixels, 6.5 μm px, 13.31 × 13.31 mm sensor
Excitation Light Source*1030 nm fs-LD PSH Module515 nm, 343 nm, 257 nm, 206 nm Wavelength (Up to 1 MHz tuning frequency)
Spectral Imaging Detection Range (sCMOS Camera)
200-1000 nm (supports UV-Vis-NIR imaging)
PL Intensity Detection Range (PMT)
190-870 nm
Spatial Resolution
Up to 500 nm resolution (with 100× oil immersion objective)
TCSPC ModuleIRF≤300 ps
TR≤60 ps
Translation StagLoad Capacity5 kg
Travel Range**30 cm (X,Y)/1.5 cm (Z)
Min. Step Size100 nm
Straightness<4 μm
Bidirectional Repeatability±0.3 μm (X,Y); ±0.15 μm (Z)
StandardIncludes driver and controller with synchronous signal output capabilities

Raman Module

Excitation SourceExcitation Wavelength532 nm/633 nm/785 nm (Other Options)
Excitation Power>150 mw (532 nm)
Raman Spectral Resolution
<1.5 cm⁻¹ (300 mm focal length, 500 nm blaze@1800g/mm)
Spatial ResolutionAxial Resolution<1 μm@10 μm Pinhole; <2 μm@50 μm Pinhole
Lateral Resolution500 nm (100×Objective)
Camera*CMOS TypeBSI sCMOS
Detection Range200-1000 nm
Resolution2048×2048 pixel (13.3×13.3 mm sensor)

SHG Module

Excitation Wavelength
Femtosecond Laser (Picosecond Laser at 1064 nm optional)
PMT DetectorDetection Range190-870 nm
High-Speed Scanning ModuleScan TypeSynchronized High-Speed Stage Scanning
Min. Step Size50 nm
Repeatability250 nm

Speed300 mm/s (max)
Excitation Polarization Control
Motorized

Microscope Module

Microscope Type
Expandable modular upright microscope
Light Source Type
LED illumination system
Illumination Mode
Episcopic illumination
Objective Configuration
5×, 10×, 20×, 40×, 50×, 60×, 100× Air/oil immersion objectives
Auto-focus Module (Optional)Response Speed40 ms
Sensitivity200 nm

Spectrometer Module

Spectrometer Type
Czerny-Turner
Focal Length
200, 300, 500 mm (selectable)
Reciprocal Linear Dispersion
2.44 nm/mm @435.84 nm @1200g/mm grating
Scanning Step Resolution
0.02 nm @1200g/mm grating
Spectral ResolutionPMT0.08 nm
CCD (25 μm pixel)0.14 nm
Wavelength Accuracy
±0.1 nm (@1200 g/mm)
Wavelength Repeatability
0.01 nm (@1200 g/mm)

Expansion Capabilities



External Field ConditioningExtendable to low temperature, high pressure, and external magnetic fields


Application

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