From Transient Absorption to Fluorescence and Non-linear Spectroscopy and beyond, TTS offers highly customizable, state-of-the-art modular products that empower your research.

World's first optical non-destructive dislocation inspection tool for SiC wafers, boules, and seed crystals, as well as a large-area perovskite inspection system and more. Redefining the inspection workflow for semiconductor manufacturers, TTS sets a new standard in precision and efficiency.