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ZTS100 measures nonlinear absorption/refraction through z-axis scanning. Features closed/open aperture detection with anti-jitter dual-channel design for precise nonlinear coefficient determination. | |||||||||
Products Feature
Precision Stage: 0.1μm resolution, <2μm repeatability.
Broad Detection: 350-1700nm power meter (50nW-40mW).
Anti-jitter: Dual-channel reference compensation.
Specifications
Precision optical displacement stage
Speed | 30 mm/s |
Minimum resolution | 0.1 μm |
Repositioning accuracy | < 2 μm |
Power detector
Test wavelength | 350-1700 nm |
Power testing range | 50 nW-40 mW |
Debounce | Simultaneous acquisition of dual-channel reference signals |
Application