Z-scan System
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Z-scan System

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ZTS100 measures nonlinear absorption/refraction through z-axis scanning. Features closed/open aperture detection with anti-jitter dual-channel design for precise nonlinear coefficient determination.
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Products Feature
Specifications
Application
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Products Feature


  • Precision Stage: 0.1μm resolution, <2μm repeatability.

  • Broad Detection: 350-1700nm power meter (50nW-40mW).

  • Anti-jitter: Dual-channel reference compensation.



Specifications


Precision optical displacement stage

Speed 30 mm/s
Minimum resolution 0.1 μm
Repositioning accuracy < 2 μm


Power detector

Test wavelength 350-1700 nm
Power testing range 50 nW-40 mW
Debounce Simultaneous acquisition of dual-channel reference signals



Application


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