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| Testing wafer size: 4' Measuring uLED type: RGB Bright-field/PL testing type: Bright field defect analysis, electrode defect analysis, PL defect analysis EL electrical testing items: V-I curve, IR1/IR2/IR3, VF1/VF2/VF3 EL colorimetric testing items: Cx, Cy, WLD, and EQE PL/AOI testing speed: 10 min/pcs (4') EL testing speed: 1.5 s/die to die | |||||||||
