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| The LFP100 is capable of probing material dynamic processes over time scales ranging from nanoseconds to seconds. The system employs a dual-detector design, achieving a signal-to-noise ratio of up to 0.1 mOD, while covering a spectral range from 250 to 900 nm (with optional extension to the near-infrared and mid-infrared regions). It is coupled with a proprietary DPSS (diode-pumped solid-state) nanosecond laser featuring a long lifetime, high stability, and fully automated wavelength switching. The system is also compatible with fluorescence lifetime measurements and can be equipped with a gated camera (ICMOS) for rapid, continuous time-resolved spectral and kinetic data acquisition. | |||||||||
The LFP100 is capable of probing material dynamic processes over time scales ranging from nanoseconds to seconds.
The system employs a dual-detector design, achieving a signal-to-noise ratio of up to 0.1 mOD, while covering a spectral range from 250 to 900 nm (with optional extension to the near-infrared and mid-infrared regions). It is coupled with a proprietary DPSS (diode-pumped solid-state) nanosecond laser featuring a long lifetime, high stability, and fully automated wavelength switching.
The system is also compatible with fluorescence lifetime measurements and can be equipped with a gated camera (ICMOS) for rapid, continuous time-resolved spectral and kinetic data acquisition.
Main Technical Indicators
| Light source | Xenon lamp |
| Spectral range | 185-2000nm |
| Mode | Transmission mode |
| Spectral detection range | 250-900nm |
| Sensitivity | ≤0.1 mOD |
| Time window | ≤0.1 s (Depends on the laser repetition rate) |
| IRF | ≤5 ns |
DPSS nanosecond OPO laser
| Laser output wavelengths | 1064/532/355/266 nm |
| OPO tunable wavelength | 210-2300 nm |
| Software | Data acquisition, analysis and fitting, etc. |
Other expandable contents
| NIR Module Detection Range | 900-1600 nm |
| MIR Module Detection Range | 1-12 μm |
| Rapid spectral acquisition | IsCMOS detector, optical shutter 3 ns |
