Characterization System for Perovskite Materials/Devices in Scientific Research
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Characterization System for Perovskite Materials/Devices in Scientific Research

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Multi-functional imaging including high-precision PL/EL intensity,emission spectroscopy, time-resolved PL, PLQE, QFLS, and quasi-J-V measurements
High-resolution photocurrent/photovoltage imaging
Optional laser/sample scanning
Compatibility with high-voltage and low-temperature modules
​Integrated control software for both data acquisition and analysis
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