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LFP100 is designed to probe dynamic processes in materials across a time scale ranging from nanoseconds to seconds. The system features a dual-detector design that achieves an excellent signal-to-noise ratio of 0.1 mOD, while covering a broad spectral range of 250-900 nm, with optional extensions for near-infrared and mid-infrared detection. | |||||||||
Products Overview
LFP100 is designed to probe dynamic processes in materials across a time scale ranging from nanoseconds to seconds. The system features a dual-detector design that achieves an excellent signal-to-noise ratio of 0.1 mOD, while covering a broad spectral range of 250-900 nm, with optional extensions for near-infrared and mid-infrared detection.
Equipped with a 500 MHz oscilloscope, the system offers a time resolution of up to 5 ns. Coupled with a DPSS nanosecond laser, it ensures long lifespan, high stability, and fully automated wavelength switching.
The system is also compatible with fluorescence lifetime testing and can be equipped with a gated camera (ICMOS) for fast and continuous time-resolved spectral/kinetic acquisition.
Specifications
Main Technical Indicators
Light source | Xenon lamp |
Spectral range | 185-2000nm |
Mode | Transmission mode |
Spectral detection range | 250-900nm |
Sensitivity | ≤1 mOD |
Time window | ≤0.1 s (Depends on the laser repetition rate) |
time resolution | ≤10 ns |
DPSS nanosecond OPO laser
Laser output wavelengths | 1064/532/355/266 nm |
OPO tunable wavelength | 210-350nm/420-700 nm/720-2300 nm |
Software | Data acquisition, analysis and fitting, and more. |
Other expandable contents
NIR Module Detection Range | 900-1600 nm |
MIR Module Detection Range | 1-12 μm |
Rapid spectral acquisition | IsCMOS detector, optical shutter 3 ns |
Application