Carrier Lifetime Imaging System for SiC Epitaxial Wafers
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Carrier Lifetime Imaging System for SiC Epitaxial Wafers

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High imaging speed
High spatial resolution
Precise measurement of carrier lifetime
Switchable Excitation wavelengths for bulk and surface detection
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Products Feature


  • High imaging speed

  • High spatial resolution

  • Precise measurement of carrier lifetime

  • Switchable Excitation wavelengths for bulk and surface detection


By delivering innovative, reliable, and scalable solutions, we empower industries to achieve unparalleled precision and efficiency, driving progress in research and manufacturing worldwide.

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